The JEOL JEM-F200 Transmission Electron Microscope (TEM) flagship is equipped with the state of the art Gatan Continuum GIF and EDS systems. The combination of the cold FEG JEM-F200 with a new generation of detector will allow high speed, high sensitivity EELS to be performed at high energy resolutions. In addition to conventional analysis, the RMMF has recently purchased a range of environmental TEM holders that will allow high sensitivity microanalysis to be performed on dynamic processes in-situ.
Some of its features include:
- Cold FEG with improved coherence over a Schottky FEG
- Improved lens and column stability
- sample auto loader (with compatible holders)
- TEM point resolution of
- STEM Point resolution of ** (BF) ** (DF)
- Gatan ContinuumS Spectrometer for super-fast EELS up to 0.45 eV energy resolution
- Duel EELS for simultaneous acquisition of two energy windows at different exposure
- Gatan Rio16 CMOS ( camera with image drift correction and rolling shutter 0.05 s exposure full frame

In-situ TEM sample holder suit for F200 and 2100F TEMs
- Protochips Fusion holder for in-situ electrical bias (up to 150 V) and heating (up to 1300C)
- Protochips Poseidon holder for in-situ liquid TEM including, heating (up to 100 C), in situ mixing of two fluids, and electro chemistry
- Gatan in-situ cooling (-170 C to -50 C) holder suitable for standard TEM specimens
- Gatan in-situ heating (RT to 800 C) holder with ±35 x-tilt suitable for standard TEM samples